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Instrument and meter
378 Series - Microscope for Semiconductor Testing
Nikon polarizing microscope LV100POL
Olympus metallographic microscope GX51
Olympus polarizing microscope BX41-P
176 Series - High Precision Measurement Microscope
Nikon Tool Microscope MM-200
Leica metallographic microscope DM4000M
Zeiss metallographic microscope Axio Examiner
Leica metallographic microscope DM1750M
Metallographic microscope DMI20
Metallographic microscope 4XCE
Zeiss Camera CCDAxioCam MRC 5
Leica metallographic microscope DM2500M
Metallographic microscope DMI50
Polarized microscope XPL-30
Zeiss microscope Axioskop 2 MAT
Wedge shaped fixture
Pressure plate zeroing fixture
Digital display semi-automatic impact testing machine - double support column
Winding thin wire fixture
Pneumatic hydraulic fixture (cross pattern)
Adjustable flat pressure plate
Agilent gas chromatograph
Hitachi UV spectrophotometer
Jena Graphite Furnace Atomic Absorption Spectrometer ZEEnit 650P
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