Zeiss metallographic microscope Axio Imager

introduce

Simple program and reliable operation
Are you looking for a microscope that can complete complex tasks, generate reliable detection results, and is easy to operate? So intelligent type for polarized light microscopy observationZeiss metallographic microscopeAxio Imager will be your satisfactory choice.

Different types of host racks are available for selection
The combination of coded, partially electric, or fully electric hosts can meet your personalized needs.

characteristic

The automatic component recognition technology is trustworthy
Automatic Component Recognition (ACR) technology enables you to conveniently use microscope settings. All electric main frames can automatically recognize the objective lens. In addition, ACR technology can also recognize reflected light modules in the all electric Z-series host. The system can automatically register the changes of components.

Vibration free design ensures reliable long-term imaging
With the help ofZeiss metallographic microscopeThe excellent stability of Axio Imager enables measurement that can change over time and observation at high magnification. The objective turntable, z-axis lifting platform, and stage are designed as a compact vibration free unit, independent of the rest of the main frame. This so-called 'stable cell' structural design can create ideal measurement conditions to obtain ultra-high quality observation results.

Extended functions make operation more comfortable
Simplify complex programs. Control all electrified components through the touch screen on the mainframe or external workstation.
Save personalized settings and achieve one click restore. Focusing operation is convenient and intuitive - a touch button designed ergonomically.
Alternatively, the polarizing microscopy system can be operated through a control panel that can be completely separated from the mainframe. The observation method and optical path manager can automatically select appropriate settings to generate reproducible and reliable observation results.

method

Cone light observation technique: using a polarizing microscope can achieve fast and reliable crystal structure analysis
Polarized microscope can simultaneously capture distortion free and cone light image information. By using a specially designed polarizing tube to assist the intermediate image plane, objects, crosshairs, and variable apertures can be visible simultaneously. By adjusting the variable aperture, the observation range of cone light can be reduced to a crystal particle size of 10 μ m. Bertrand's optical path has been conveniently switched. This feature allows you to quickly switch between different technologies - even when capturing images or using video devices.

Consistent measurement performance
With the help of a vernier scale that can be rotated 360 ° and 0.1 °, and a ball axis mounted stage, measurements can be easily achieved (e.g. for measuring the cleavage angle of minerals)
Optical path difference measurement or strain measurement

A large number of spectral compensators are available, covering the measurement range from 0 to 30 λ.
Compensator with fixed optical path difference
Full waveplate λ
Quarter wave plate λ/4
Full waveplate λ, rotatable angle+/-8 °

Compensator with variable optical path difference
Optical wedge compensator 0-4 λ
Measurement compensator
-Berek tilt compensator 0-5 λ
-Berek tilt compensator 0-30 λ

Axio Imager can also provide more methods, such as:
Thermal microscopy technology
Use Zeiss AxioVision software for digital analysis (such as grain size analysis or particle size analysis)