Product NameXRD-6100 Shimadzu X-X-ray diffractometer

Product Code: cp79

X-ray diffractometer can perform non-destructive analysis of samples in the atmosphere, including qualitative analysis of substances, determination of lattice constants, and stress measurement. Moreover, quantitative analysis can be conducted through peak area calculation.

Various analyses such as particle size/crystallinity/precision X-ray structure analysis can be conducted through half width, peak shape, etc.

Equipped with a high-precision vertical angle measuring instrument, suitable for measuring various samples such as powders, films, difficult to fix samples, soluble samples, etc.

Equipped with a high-precision vertical angle measuring instrument, suitable for measuring various samples such as powders, films, difficult to fix samples, soluble samples, etc.

XRD-6100 has an intrinsic safety structure.

The X-ray tube can only be opened when the door chain mechanism is locked, providing high safety.

Equipped with a vertical angle measuring instrument with high-speed operation (1000 °/min) and high-precision angle reproducibility (± 0.0001 °), it can measure various samples.

The driving mechanism is an independent 2-axis drive, which can choose between θ -2 θ linkage or θ, 2 θ axis independent drive, especially effective for thin film measurement.

Equipped with a wide range of accessories (software/hardware) to meet various needs.

Revision of corresponding industrial environment determination standards/industrial environment assessment standards

X-ray diffractometer XRD-6100 environmental measurement package

Suitable for qualitative/quantitative analysis of free silicon and asbestos in industrial environments.