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X-ray fluorescence coating thickness gauge 920
Using X-ray fluorescence (XRF) for coating thickness measurement and material analysis to improve process and quality control
Product details
Using X-ray fluorescence (XRF) for coating thickness measurement and material analysis to improve process and quality control.
X-Strata is a compact, sturdy, and reliable desktop X-ray fluorescence analysis device for quality control, providing simple, fast, and non-destructive coating thickness measurement and material analysis.
It has demonstrated excellent analytical capabilities in industrial fields such as electronics, metal electroplating, metal alloys, and precious metal analysis, and can measure the thickness of multiple coatings.
The X-Strata series of coating thickness gauges provides:
Non destructive analysis: No need for sample preparation
Industry certified technology and reliability ensure annual revenue generation
Easy to operate, only requiring simple training
Analysis only requires three steps
Outstanding analytical accuracy and precision
Having over 20 years of rich experience in the field of coating thickness measurement
Use a powerful and easy-to-use X-ray fluorescence spectrometer to measure coating thickness, ensuring quality while reducing costs
A simple quality control analyzer that meets the requirements of coating thickness measurement and material analysis.
New model design
Quick analysis (in seconds) of 1-4 layer coating thickness
Multiple specifications, such as standard sample stage, deepening sample stage, or automatic programmable sample stage, to meet all sample types
The slotted sample chamber can detect large-area samples, such as printed circuit boards, etc
Compliant with ISO3487 and ASTM B568 testing methods
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