Shanghai Yucheng Optoelectronics Technology Co., Ltd
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Wavefront Tester - Visible Light
Wavefront Tester - Visible Light
Product details

shack-hartmann wavefront sensor

Shack Hartmann (SH) wavefront sensors are widely used in adaptive optics. Its basic principle is to divide the wavefront into several sub apertures, measure the wavefront deviation values in two orthogonal directions on each sub aperture, that is, the wavefront slope, and then perform wavefront reconstruction calculation based on the wavefront slope on the sub aperture to obtain the wavefront phase on the entire aperture

The world's highest resolution wavefront sensor, patented technology product -4-wave transverse shear interferometry, is a further testing optimization based on Hartmann. This technology can directly measure any wavefront with unparalleled resolution and high dynamic adjustable range. This innovative technology and product have been increasingly applied in various industries, and their products can be used for laser beam quality analysis, measurement of various indicators such as EFL, curvature radius, MTF, PSF of optical products, etc

SID4 visible&SID4 HR (visible light)

   SID4visibleSID4HR

The SID4 (visible) wavefront analyzer can measure both phase and intensity simultaneously and has a very high resolution (160x120), while the SID4 HR wavefront analyzer has a higher resolution (400 x300). Based on phase based patented wavefront sensing technology, it has high resolution, large dynamics, and better usability.

main features

High resolution 160 * 120 (SID4 visible) 400 * 300 (SID4 HR)

Both divergent and parallel beams can be directly measured

Color correction in the range of 400-1100nm

Self calibration is insensitive to vibration and easy to adjust

Recommended use

Laser: Laser measurement, suitable for optical instruments

Optics: lens testing, surface measurement

Biology: Adapting to Optical Microscopy

SID 4 detailed specifications

SID4 (visible light)

SID4visible

SID4HR

unit

Wavelength range (nm)

400~1100

400~1100

nm

aperture size

3.6*4.8

8.9×11.8

mm^2

spatial resolution

29.6

29.6

um

Phase and intensity sampling

160*120(>19000)

300*400(>120000)

points

resolution

<2

<2

nmRMS

precision

10

15

nmRMS

dynamic range

>100

>500

um

collection rates

>100

>30

fps

Real time processing frequency

>10

>3

fps

computer connection

GigaEthernet

GigaEthernet

Size (w * h * lmm)

54*46*75.4

54*46*79

mm

Weight (g)

~250

~250

g

Yucheng Optoelectronics Wavefront Sensor _ Phasic.spdf

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