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Surface copper probe SRP-4
Advanced Micro resistance Testing Technology Applied to Surface Copper Probe SRP-4
Product details

Surface copper probe SRP-4



Apply advanced micro resistance testing technology. The tethered probe consists of four probes, with AB as the positive electrode and CD as the negative electrode; When measuring, there will be a small resistance in the current from the positive pole to the negative pole. The surface copper thickness can be accurately and reliably obtained through the functional relationship between the resistance value and the thickness value, without being affected by the insulation board layer and the copper layer on the back of the circuit board. The worn SRP-4 probe can be replaced by itself and is a patented product of Oxford Instruments. The illumination function and protective cover of the probe facilitate accurate positioning during measurement.

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