1、 Purpose:

The ZXGP-500 series bright dark field silicon wafer inspection microscope is suitable for microscopic observation of solar cell silicon wafers. This instrument is equipped with a large moving range stage, a falling beam illumination device, a long working distance flat field achromatic objective lens, a large field eyepiece, clear images, good contrast, and is also equipped with a polarizing device and a high pixel digital camera This instrument is equipped with a dark field objective lens, which makes the image clearer when observing silicon wafers. It is an ideal instrument for detecting the microstructure distribution of the "pyramid" of solar cell silicon wafers and analyzing defects in silicon wafers

The silicon wafer inspection microscope can observe dislocations, scratches, and broken edges that are difficult to observe with the naked eye; It can also analyze the impurities and residual components of silicon wafers Impurities include particles, organic impurities, inorganic impurities, metal ions, silicon powder dust, etc., which can cause discoloration, bluing, blackening and other phenomena in the silicon wafer after grinding, resulting in unqualified grinding It is one of the commonly used detection instruments in the production process of solar cell silicon wafers.

technical standard