*Parallel flat crystalIt is based on the principle of light wave interference and utilizesFlat crystalThe interference fringes that appear between the measuring surface and the measured surface of the specimen are used to measure the degree of error in the measured surface.
*Parallel flat crystalHas high-precision flatness and parallelism.
*ParallelFlat crystalUsed for verifying the flatness of measuring surfaces and parallelism of two relative measurements of micrometers, lever micrometers, lever calipers, and micrometer calipers. Parallel flat crystals are divided into four series, each series is divided into six groups, with four pieces in each group.
Requirements for Parallel Flat Crystal Technology
| group | Parallelism of two working faces | Flatness of working face | Flatness within 2/3D range |
| I、II | 0.6 | 0.1 | 0.05 |
| III | 0.8 | 0.1 | 0.05 |
| IV | 1.0 | 0.1 | 0.05 |
