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Evaluation system for insulation degradation and ion migration characteristics
The evaluation system for insulation degradation and ion migration characteristics is facing the increasingly small, lightweight, and high-density pac
Product details
Details introduction:
Evaluation system for insulation degradation and ion migration characteristicsPurpose:
Faced with the increasingly small, lightweight, and high-density packaging of electronic products, the phenomenon of poor insulation and ion migration caused by factors such as condensation and moisture absorption is becoming more and more prominent. The insulation resistance degradation (ion migration) evaluation system, coupled with a high-temperature and high humidity test box linkage, can achieve high-precision continuous monitoring and efficiently and conveniently evaluate the life and insulation resistance degradation related issues caused by ion migration.
Evaluation system for insulation degradation and ion migration characteristicsApplicable standards:
JPCA-ET04、IPC-TM-650_2.6.3F 、IPC-TM-650_2.6.3.1E、IPC-TM-650_2.6.3.4A 、IPC-TM-650_2.6.3.6。
Evaluation system for insulation degradation and ion migration characteristicsTechnical specifications:
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Product Name |
Evaluation system for insulation degradation and ion migration characteristics |
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model |
SIR13 |
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120Vsubstrate |
250Vsubstrate |
500Vsubstrate |
1000Vsubstrate |
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Substrate Testing Department |
Test resistance range |
320Ω～120TΩ |
320Ω～2.5TΩ |
320Ω～250TΩ |
320Ω～500TΩ |
320Ω～1000TΩ |
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Number of testing channels |
8ch/substrate |
16ch/substrate |
8ch/substrate |
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connecting cable |
2Root pair/substrate 4Line type |
2Root pair/substrate Load test cable×2 |
2Root pair/substrate Load cable×1Test cables×1 |
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Electrical Characteristics |
electricity press plus load ministry |
Loading voltage |
voltage range1 |
0.10V～120.00V |
0.1V～250.0V |
1.0V～500.0V |
1.0V～1000.0V |
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voltage range2 |
0.100V～12.000V |
-- |
-- |
-- |
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Load setting resolution |
0.10V/0.001V |
0.1V |
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Basic loading accuracy |
±0.3%/FS |
±0.3%/FS + 0.5V/FS |
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Higher output power |
96mW/ch |
256mW/8ch |
300mW/ch |
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Number of loading groups |
1Group（1ch/1Group) |
2Group（8ch/1Group) |
1Group（8ch/1Group) |
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Load range |
2range |
1range |
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Number of loading channels |
1ch |
8ch |
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Large load capacity |
2.0μF/1ch |
0.47μF/8ch |
3300pF/1ch |
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electricity press apparent show device |
Display range |
2range |
1range |
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monitor scope |
voltage range1 |
0.00V～120.00V |
0.0V～250.0V |
0.0～500.0V |
0.0V～1000.0V |
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voltage range2 |
0.000V～12.000V |
-- |
-- |
-- |
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Display resolution |
0.10V/0.001V |
0.1V |
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Basic display accuracy |
±0.3%/FS |
±0.3%/FS + 0.5V/FS |
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Display segmentation unit |
1ch |
1Group or1ch |
1ch |
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Display cycle |
40ms |
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Number of display channels |
8ch |
16ch |
8ch |
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electricity flow measure try |
Test range |
3range |
2range |
3range |
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monitor scope |
current range1 |
0.00μA～320.00μA |
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current range2 |
0.0000μA～3.2000μA |
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current range3 |
0.00nA～32.000nA |
-- |
0.000nA～32.000nA |
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range setting |
320.00μA·3.2000μA ·32.000nA·automatic |
320.00μA·3.2000μA·automatic |
320.00μA·3.2000μA·32.000nA·automatic |
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Test smaller resolution |
current range1 |
10nA |
10nA |
10nA |
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current range2 |
100pA |
100pA |
100pA |
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current range3 |
1pA |
1pA |
1pA |
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Basic testing accuracy |
±0.3%/FS |
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number of channels |
8ch |
16ch |
8ch |
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Data collection cycle |
regularly30s(Smaller)/During ion migration40ms(Smaller) |
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Ionic migration testing speed |
40ms |
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Leakage detection |
400μs/ch |
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test cycle |
40ms |
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Other functions |
Self diagnosis |
External standard resistor diagnosis ※optional |
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chain |
Test the automatic interruption function when the box door is opened ※optional |
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Wire breakage detection |
Terminal breakage detection function |
-- |
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Temperature and humidity recording in the test tank |
Add temperature and humidity testing substrate, with the help of3CS·keylessThe software is large and can be included4Data from a slot ※optional |
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Sample temperature recording |
pass3CS SMUEach channel can include1a point ※optional |
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Large system composition |
SIR13 |
80ch（10Substrate) |
160ch（10Substrate) |
80ch（10Substrate) |
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SIR13mini |
24ch（3Substrate) |
48ch（3Substrate) |
24ch（3Substrate) |
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Control Department |
System control computer |
Windows XP Pro. SP2suitable forWindows2000）Pentium 500MHzabove memory256Mbyteabove |
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Connection of testing department |
GP-IBorEthernet |
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other |
Power outage countermeasures |
Save and record data before power outage, and continue recording after power on ※Uninterrupted power supply must |
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control unit |
structural type |
SIR13 |
SMU 10Slot style Overall dimensions:W430×H300×D620※Excluding protruding parts Weight: approx.30kg（SMU 10When equipped) Current consumption:5AThe following（100VWhen in use) |
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SIR13mini |
SMU 3Slot style Overall dimensions:W220×H370×D390※Excluding protruding parts Weight: approx.20kg（SMU 3When equipped) Current consumption:2AThe following（100VWhen in use) |
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Noise resistance capability |
1μspulse2KV 1minute |
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insulation resistance |
DC500V 100MΩabove |
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Use power supply |
AC85V～264V 50/60Hz |
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Usage environment |
temperature+10℃～+40℃ humidity75%RHBelow (without condensation) |
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Save the environment |
temperature-10℃～+ 60℃ |
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Evaluation system for insulation degradation and ion migration characteristics product image
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