Sixian Optoelectronics Technology (Shanghai) Co., Ltd
Home>Products>Blind hole depth measurement
Product Groups
Firm Information
  • Transaction Level
    VIP member
  • Contact
  • Phone
    18721723850
  • Address
    117, 1st Floor, Building 2, No. 171 Meisheng Road, China (Shanghai) Pilot Free Trade Zone
Contact Now
Blind hole depth measurement
Probe measurement requires scanning the three-dimensional morphology of the probe surface on the panel
Product details
  • Probe measurement

    Measurement requirements
    Scan the surface three-dimensional morphology of the panel probe and extract the wear condition of the top of the profile measurement probe

    Overview of Main Features
    1. Non contact measurement, integrated design

    2. Three dimensional morphology scanning and multifunctional data processing
    3. Suitable for precise measurement of various materials

    4. Easy to use and convenient to assemble and disassemble

    5. Fast scanning speed and high positioning accuracy

    6. Repetitive accuracy guarantee from ± 0.5 to ± 1 μ m

    7. High stability and strong anti-interference ability

    imgimg

    measurement results
    The height of the probe before wear is about 100 μ m, and after wear it is about 80 μ m

    Addressing the current issues with measuring devices

    1. There are certain requirements for measuring materials
    2. Contact measurement may cause damage to the measuring material
    3. The measurement range is small, the position is uncertain, and the measurement is difficult
    4. Slow measurement speed, low accuracy, and large measurement errors

    5. Complex structure and high cost

  • Online inquiry
    • Contacts
    • Company
    • Telephone
    • Email
    • WeChat
    • Verification Code
    • Message Content

    Successful operation!

    Successful operation!

    Successful operation!