Probe measurement
Measurement requirements
Scan the surface three-dimensional morphology of the panel probe and extract the wear condition of the top of the profile measurement probe
Overview of Main Features
1. Non contact measurement, integrated design
2. Three dimensional morphology scanning and multifunctional data processing
3. Suitable for precise measurement of various materials
4. Easy to use and convenient to assemble and disassemble
5. Fast scanning speed and high positioning accuracy
6. Repetitive accuracy guarantee from ± 0.5 to ± 1 μ m
7. High stability and strong anti-interference ability


measurement results
The height of the probe before wear is about 100 μ m, and after wear it is about 80 μ m
Addressing the current issues with measuring devices
1. There are certain requirements for measuring materials
2. Contact measurement may cause damage to the measuring material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. Slow measurement speed, low accuracy, and large measurement errors
5. Complex structure and high cost
