The BMM-100 DIC type differential interference digital metallographic microscope is a cost-effective optical instrument for detection. Adopting an excellent infinite optical imaging system, with built-in LED high brightness illumination, and introducing differential interference microscopy observation function. The binocular photography observation head reflects the true reproduction of visual observation, as well as the integration of digital photography and microscopic imaging technology. The observed interferometric images have a stronger sense of three dimensionality and are suitable for observing the surface morphology of non transparent materials, such as the microscopic morphology of conductive particles in LCD screens. It is an ideal instrument for quality inspection and structural research in the manufacturing field.
Performance Characteristics
★ The product adopts an infinite optical imaging system, and can choose 5X, 10X, 20X equal working distance flat field achromatic stress free objective lenses, matched with corresponding differential interferometry (DIC card) for microscopic observation at different magnifications;
The lighting system adopts high brightness and long working time LED devices, which have the characteristics of compact structure and easy use, especially suitable for the environmental requirements of online detection;
★ Adopting a column style height adjustment method, the thickness range of the observed sample is wider

Standard Configuration